Crystal imperfection of AZO bulk as sputtering target prepared by mechanical alloying and consolidation: Effect of Al-doping concentration and sintering temperature 1Physics Departement, Faculty of Mathematic and Sciences, Universitas Negeri Semarang Abstract ZnO thin film has been studied intensively because of the unique properties such as direct band gap, large excitation binding energy, high electrical conductivity, high optical gain, and high optical transmittance in the visible and infrared region. ZnO thin film is potentially for electronic and optoelectronic devices applications. The electrical and optical properties of ZnO thin film can be improved by doping with Al-elements. Various technique to the deposition of Al-doped ZnO (or AZO) thin films have been reported. Among these techniques, the sputtering has many advantages, such as a relatively high deposition rate, uniform deposition on large area substrates, uniform thickness control, stable chemical composition (homogeneity), higher film density, simple stoichiometry control, and reproducibility. In thin film deposition using sputtering technique, crystallinity of sputtering target is important factor beside the growth parameters and postgrowth conditions. Keywords: Crystal imperfection , AZO bulk, sputtering target, crystalline size, strain Topic: Optimization Research Based on Local Resources |
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